메뉴 건너뛰기




Volumn , Issue , 2004, Pages 60-63

RF substrate noise characterization for CMOS 0.18μm

Author keywords

Deep N well (DNW); Guard ring (GR); Radio Frequency (RF); Substrate noise suppression

Indexed keywords

DESIGN; MICROWAVE ISOLATORS; RADIO SYSTEMS; SIGNAL PROCESSING;

EID: 29044444843     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (6)
  • 1
    • 0035717520 scopus 로고    scopus 로고
    • Comprehensive study of substrate noise isolation for mixed-signal circuits
    • Electron Devices Meeting, 2001, IEEE International, 2-5 Dec.
    • K.H. To, P. Welch, S. Bharatan, H. Lehning*, T. L Huynh*, R. Thoma, D. Monk, W. M. Huang and V. Ilderem, "Comprehensive Study of Substrate Noise Isolation for Mixed-Signal Circuits," Electron Devices Meeting, 2001, IEDM Technical Digest, IEEE International, 2-5 Dec. 2001, pp 22.7.1-22.7.4
    • (2001) IEDM Technical Digest
    • To, K.H.1    Welch, P.2    Bharatan, S.3    Lehning, H.4    Huynh, T.L.5    Thoma, R.6    Monk, D.7    Huang, W.M.8    Ilderem, V.9
  • 3
    • 84907699358 scopus 로고    scopus 로고
    • Impact of deep N-well implantation on substrate noise coupling and RF transistor performance for systems-on-a-chip integration
    • 24-26 September Frenze, Italy
    • K. W. Chew, J. Zhang, K. Shao, W. B. Loh, S-. F. Chu, "Impact of Deep N-well Implantation on Substrate Noise Coupling and RF Transistor Performance for Systems-on-a-Chip Integration," 32 European Solid-State Device Research Conference, 24-26 September 2002, Frenze, Italy
    • (2002) 32 European Solid-state Device Research Conference
    • Chew, K.W.1    Zhang, J.2    Shao, K.3    Loh, W.B.4    Chu, S.F.5
  • 4
    • 0035473961 scopus 로고    scopus 로고
    • Improving the RF performance of 0.18μm CMOS with deep n-well implantation
    • IEEE, Oct.
    • Jiong-Guang Su, Heng-Ming Hsu, Shyh-Chyi Wong, Member, IEEE, Chun-Yen Chang, Fellow, IEEE, Tiao-Yuan Huang, Fellow, IEEE, and Jack Yuan-Chen Sun, Fellow, IEEE, "Improving the RF Performance of 0.18μm CMOS With Deep n-Well Implantation," Electron Device Letters, IEEE, Volume 22, Issue 10, Oct. 2001, pp 481-483
    • (2001) Electron Device Letters , vol.22 , Issue.10 , pp. 481-483
    • Su, J.-G.1    Hsu, H.-M.2    Wong, S.-C.3    Chang, C.-Y.4    Huang, T.-Y.5    Sun, J.Y.-C.6
  • 5
    • 0043092016 scopus 로고    scopus 로고
    • Characterization and modeling of the substrate noise and its impact on the phase noise of VCO
    • 2003 IEEE, 8-10 June
    • Huailin Liao, Subhash C. Rustagi, Jinglin Shi, Yong Zhong Xiong, "Characterization and Modeling of the Substrate Noise and Its Impact on the Phase Noise of VCO," Radio Frequency Integrated Circuits (RF1C) Symposium, 2003 IEEE, 8-10 June 2003 pp247-250
    • (2003) Radio Frequency Integrated Circuits (RF1C) Symposium , pp. 247-250
    • Liao, H.1    Rustagi, S.C.2    Shi, J.3    Xiong, Y.Z.4
  • 6
    • 2442530854 scopus 로고    scopus 로고
    • Substrate noise-coupling characterization and efficient suppression in CMOS technology
    • May
    • Wen-Kuan Yeh, Shuo-Mao Chen and Yean-Kuen Fang, "Substrate Noise-Coupling Characterization and Efficient Suppression in CMOS Technology," IEEE Transaction Electron Devices, Vol.51, No.5, May 2004, pp817-819
    • (2004) IEEE Transaction Electron Devices , vol.51 , Issue.5 , pp. 817-819
    • Yeh, W.-K.1    Chen, S.-M.2    Fang, Y.-K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.