Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes

Microscopy and Microanalysis

Volumn 11, Issue 5, 2005, Pages 401-409

  Kirkland, Angus I ^a   Meyer, Rüdiger R ^a   Sloan, J ^a   Hutchison, J L ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberration measurement; High resolution electron microscopy; Image reconstruction

Indexed keywords

CARBON NANOTUBE; IODIDE;

CHEMISTRY; CONFERENCE PAPER; CRYSTALLIZATION; METHODOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLIZATION; IODIDES; MICROSCOPY, ELECTRON, TRANSMISSION; NANOTUBES, CARBON;

EID: 28744448129     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927605050385     Document Type: Conference Paper

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