From discrete hopping to continuum modeling on vicinal surfaces with applications to Si(001) electromigration

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 15, 2005, Pages

  Zhao, Tong ^a   Weeks, John D ^a   Kandel, Daniel ^b,c  

^a Bldg 142   (United States)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^c KLA TENCOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28744444759     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.155326     Document Type: Article

References (27)

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