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Volumn 49, Issue 12, 2005, Pages 1942-1946

Carrier effective mobilities in germanium MOSFET inversion layer investigated by Monte Carlo simulation

Author keywords

Effective mobility; Germanium; Monte Carlo

Indexed keywords

CARRIER CONCENTRATION; COMPUTER SIMULATION; CONCENTRATION (PROCESS); GERMANIUM; MONTE CARLO METHODS; MOSFET DEVICES;

EID: 28044470539     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2005.08.010     Document Type: Article
Times cited : (13)

References (21)
  • 1
    • 0036923998 scopus 로고    scopus 로고
    • A sub-400/spl deg/C germanium MOSFET technology with high-/spl kappa/dielectric and metal gate
    • C.O. Chui, H. Kim, D. Chi, and B.B. Triplett A sub-400/spl deg/C germanium MOSFET technology with high-/spl kappa/dielectric and metal gate IEDM Tech Dig 2002 437
    • (2002) IEDM Tech Dig , pp. 437
    • Chui, C.O.1    Kim, H.2    Chi, D.3    Triplett, B.B.4
  • 2
    • 0036932194 scopus 로고    scopus 로고
    • High mobility p-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric
    • H. Shang, H.O. Schmidt, K.K. Chan, and M. Copel High mobility p-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric IEDM Tech Dig 2002 441
    • (2002) IEDM Tech Dig , pp. 441
    • Shang, H.1    Schmidt, H.O.2    Chan, K.K.3    Copel, M.4
  • 3
    • 12144285893 scopus 로고    scopus 로고
    • Self-aligned n-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate
    • H. Shang, K.L. Lee, P. Kozlowski, and C. D'Emic Self-aligned n-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate IEEE Electron Dev Lett 25 2004 135 137
    • (2004) IEEE Electron Dev Lett , vol.25 , pp. 135-137
    • Shang, H.1    Lee, K.L.2    Kozlowski, P.3    D'Emic, C.4
  • 4
    • 0024127781 scopus 로고
    • Self-aligned germanium MOSFETs using a nitrided native oxide gate insulator
    • J.J. Rosenberg, and S.C. Martin Self-aligned germanium MOSFETs using a nitrided native oxide gate insulator IEEE Electron Dev Lett 9 1988 639 640
    • (1988) IEEE Electron Dev Lett , vol.9 , pp. 639-640
    • Rosenberg, J.J.1    Martin, S.C.2
  • 6
    • 0018683243 scopus 로고
    • Characterization of the electron mobility in the inverted 〈100〉 Si surface
    • A.G. Sabnis, and J.T. Clemens Characterization of the electron mobility in the inverted 〈100〉 Si surface IEDM Tech Digest 1979 18 21
    • (1979) IEDM Tech Digest , pp. 18-21
    • Sabnis, A.G.1    Clemens, J.T.2
  • 7
    • 0019048875 scopus 로고
    • Electron mobility in inversion and accumulation layers on thermally oxidized silicon surfaces
    • S.C. Sun, and J.D. Plummer Electron mobility in inversion and accumulation layers on thermally oxidized silicon surfaces IEEE Trans Electron Dev ED-27 1994 1497 1508
    • (1994) IEEE Trans Electron Dev , vol.ED-27 , pp. 1497-1508
    • Sun, S.C.1    Plummer, J.D.2
  • 8
    • 0023090016 scopus 로고
    • A Semi-empirical model of the MOSFET inversion layer mobility for low-temperature operation
    • N.D. Arora, and G.S. Gildenblat A Semi-empirical model of the MOSFET inversion layer mobility for low-temperature operation IEEE Trans Electron Dev ED-34 1987 89 93
    • (1987) IEEE Trans Electron Dev , vol.ED-34 , pp. 89-93
    • Arora, N.D.1    Gildenblat, G.S.2
  • 9
    • 0027540858 scopus 로고
    • Universal effective mobility of empirical local mobility models for n- and p-channel silicon MOSFETs
    • H.S. Wong Universal effective mobility of empirical local mobility models for n- and p-channel silicon MOSFETs Solid-State Electron 36 1993 179 188
    • (1993) Solid-State Electron , vol.36 , pp. 179-188
    • Wong, H.S.1
  • 10
    • 0026205305 scopus 로고
    • Physical understanding of low-field carrier mobility in silicon MOSFET inversion layer
    • K. Lee, J.S. Choi, S.P. Sim, and C.K. Kim Physical understanding of low-field carrier mobility in silicon MOSFET inversion layer IEEE Trans Electron Dev ED-38 1991 1905 1912
    • (1991) IEEE Trans Electron Dev , vol.ED-38 , pp. 1905-1912
    • Lee, K.1    Choi, J.S.2    Sim, S.P.3    Kim, C.K.4
  • 11
    • 0024178927 scopus 로고
    • On the universality of inversion-layer mobility in N- and P-channel MOSFET's
    • S. Takagi, M. Iwase, and A. Toriumi On the universality of inversion-layer mobility in N- and P-channel MOSFET's IEDM Tech Dig 88 1988 398 401
    • (1988) IEDM Tech Dig , vol.88 , pp. 398-401
    • Takagi, S.1    Iwase, M.2    Toriumi, A.3
  • 13
    • 33744685518 scopus 로고
    • Nonlocal pseudopotential calculations for the electronic structure of eleven diamond and zinc-blende semiconductors
    • J.R. Chelikowsky, and M.L. Cohen Nonlocal pseudopotential calculations for the electronic structure of eleven diamond and zinc-blende semiconductors Phys Rev B 14 1976 556
    • (1976) Phys Rev B , vol.14 , pp. 556
    • Chelikowsky, J.R.1    Cohen, M.L.2
  • 14
    • 35949025517 scopus 로고
    • The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials
    • Carlo Jacoboni, and L. Reggiani The Monte Carlo method for the solution of charge transport in semiconductors with applications to covalent materials Rev Mod Phys 55 3 1983 645
    • (1983) Rev Mod Phys , vol.55 , Issue.3 , pp. 645
    • Carlo, J.1    Reggiani, L.2
  • 15
    • 0042341731 scopus 로고    scopus 로고
    • Comparative full-band Monte Carlo study of Si and Ge with screened pseudopotential-based phonon scattering rates
    • Phuong Hoa Nguyen, and Karl R Hofmann Comparative full-band Monte Carlo study of Si and Ge with screened pseudopotential-based phonon scattering rates J Appl Phys 94 2003 376
    • (2003) J Appl Phys , vol.94 , pp. 376
    • Nguyen Phuong, H.1    Hofmann Karl, R.2
  • 18
    • 0028747841 scopus 로고
    • On the universality of inversion layer mobility in Si MOSFET's: Part I-Effects of substrate impurity concentration
    • S.-i. Takagi, A. Toriumi, M. Iwase, and H. Tango On the universality of inversion layer mobility in Si MOSFET's: Part I-Effects of substrate impurity concentration IEEE Trans Electron Dev 41 1994 2357 2362
    • (1994) IEEE Trans Electron Dev , vol.41 , pp. 2357-2362
    • Takagi, S.-I.1    Toriumi, A.2    Iwase, M.3    Tango, H.4
  • 20
    • 0032072525 scopus 로고    scopus 로고
    • Monte Carlo simulation of electron transport properties in extremely thin SOI MOSFET's
    • F. Gamiz, J.A. Lopez-Villanueva, J. Banqueri, and J.E. Carceller Monte Carlo simulation of electron transport properties in extremely thin SOI MOSFET's IEEE Trans Electron Dev 45 1998 1122 1125
    • (1998) IEEE Trans Electron Dev , vol.45 , pp. 1122-1125
    • Gamiz, F.1    Lopez-Villanueva, J.A.2    Banqueri, J.3    Carceller, J.E.4
  • 21
    • 4243227379 scopus 로고
    • Monte Carlo study of electron transport in silicon inversion layers
    • M.V. Fischetti, and S.E. Laux Monte Carlo study of electron transport in silicon inversion layers Phys Rev B48 1993 2244
    • (1993) Phys Rev , vol.48 , pp. 2244
    • Fischetti, M.V.1    Laux, S.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.