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Volumn 2002-January, Issue , 2002, Pages 159-162

Self-consistent single-particle simulation

Author keywords

Couplings; Doping; High definition video; Hydrodynamics; Modeling; Monte Carlo methods; MOSFET circuits; Poisson equations; Stability; Systems engineering and theory

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; COUPLINGS; DOPING (ADDITIVES); DRAIN CURRENT; FLUID DYNAMICS; HYDRODYNAMICS; INTELLIGENT SYSTEMS; ITERATIVE METHODS; MODELS; MOSFET DEVICES; NONLINEAR EQUATIONS; POISSON EQUATION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DOPING;

EID: 0038604302     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SISPAD.2002.1034541     Document Type: Conference Paper
Times cited : (9)

References (10)
  • 1
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    • Electron transport in a model Si transistor
    • K. Banoo and M. S. Lundstrom, "Electron transport in a model Si transistor," Solid-State Electron., vol. 44, pp. 1689-1695, 2000.
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    • Banoo, K.1    Lundstrom, M.S.2
  • 2
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    • MOSFET modeling into the ballistic regime
    • Seattle (U.S.A.), Sept.
    • J. D. Bude, "MOSFET modeling into the ballistic regime," in Proc. SISPAD, Seattle (U.S.A.), Sept. 2000, pp. 23-26.
    • (2000) Proc. SISPAD , pp. 23-26
    • Bude, J.D.1
  • 3
    • 35949009958 scopus 로고
    • Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects
    • M. V. Fischetti and S. E. Laux, "Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects," Phys. Rev. B, vol. 38, pp. 9721-9745, 1988.
    • (1988) Phys. Rev. B , vol.38 , pp. 9721-9745
    • Fischetti, M.V.1    Laux, S.E.2
  • 4
    • 0027694792 scopus 로고
    • Time stability of Monte Carlo device simulation
    • P. W. Rambo and J. Denavit, "Time stability of Monte Carlo device simulation," IEEE Trans. Computer-Aided Des., vol. 12, pp. 1734-1741, 1993.
    • (1993) IEEE Trans. Computer-Aided Des. , vol.12 , pp. 1734-1741
    • Rambo, P.W.1    Denavit, J.2
  • 5
    • 0000135289 scopus 로고    scopus 로고
    • Full-band Monte Carlo investigation of hot carrier trends in the scaling of metal-oxide-semiconductor field-effect transistors
    • A. Duncan, U. Ravaioli, and J. Jakumeit, "Full-band Monte Carlo investigation of hot carrier trends in the scaling of metal-oxide-semiconductor field-effect transistors," IEEE Trans. Electron Devices, vol. 45, pp. 867-876, 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , pp. 867-876
    • Duncan, A.1    Ravaioli, U.2    Jakumeit, J.3
  • 6
    • 0033357461 scopus 로고    scopus 로고
    • Efficient full-band Monte Carlo simulation of silicon devices
    • C. Jungemann, S. Keith, M. Bartels, and B. Meinerzhagen, "Efficient full-band Monte Carlo simulation of silicon devices," IEICE Trans. Electron., vol. E82-C, pp. 870-879, 1999.
    • (1999) IEICE Trans. Electron. , vol.E82-C , pp. 870-879
    • Jungemann, C.1    Keith, S.2    Bartels, M.3    Meinerzhagen, B.4
  • 7
    • 0034295786 scopus 로고    scopus 로고
    • Ultrasmall MOSFETs: The importance of the full Coulomb interaction on device characteristics
    • W. J. Gross, D. Vasileska, and D. K. Ferry, "Ultrasmall MOSFETs: The importance of the full Coulomb interaction on device characteristics," IEEE Trans. Electron Devices, vol. 47, pp. 1831-1837, 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 1831-1837
    • Gross, W.J.1    Vasileska, D.2    Ferry, D.K.3
  • 8
    • 0024647039 scopus 로고
    • A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFET's
    • F. Venturi, R. K. Smith, E. C. Sangiorgi, M. R. Pinto, and B. Riccó, "A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFET's," IEEE Trans. Computer-Aided Des., vol. 8, pp. 360-369, 1989.
    • (1989) IEEE Trans. Computer-Aided Des. , vol.8 , pp. 360-369
    • Venturi, F.1    Smith, R.K.2    Sangiorgi, E.C.3    Pinto, M.R.4    Riccó, B.5
  • 10
    • 0033711577 scopus 로고    scopus 로고
    • Efficient Monte Carlo device simulation with automatic error control
    • Seattle (U.S.A.), Sept.
    • F. M. Bufler, A. Schenk, and W. Fichtner, "Efficient Monte Carlo device simulation with automatic error control," in Proc. SISPAD, Seattle (U.S.A.), Sept. 2000, pp. 27-30.
    • (2000) Proc. SISPAD , pp. 27-30
    • Bufler, F.M.1    Schenk, A.2    Fichtner, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.