Optical properties of ordered mesoporous layers of silica

Thin Solid Films

Volumn 495, Issue 1-2, 2006, Pages 237-242

  Cheyssac, P ^a   Klotz, M ^b   Sondergard E ^b  

^a UNIVERSITÉ CÔTE D'AZUR   (France)

^b SAINT GOBAIN RECHERCHE   (France)

Author keywords

Anderson localization; Mesoporous materials; Optical properties

Indexed keywords

MESOPOROUS MATERIALS; OPTICAL PROPERTIES; OPTICAL SENSORS; REFLECTION; X RAY SCATTERING;

ANDERSON LOCALIZATION; DIELECTRIC FUNCTIONS; OPTICAL INDICES;

SILICA;

EID: 28044467378     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.08.373     Document Type: Conference Paper

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