Thickness-dependent properties of sprayed iridium oxide thin films

Materials Chemistry and Physics

Volumn 80, Issue 3, 2003, Pages 667-675

  Patil, P S ^a   Chigare, P S ^b   Sadale, S B ^a   Seth, T ^d   Amalnerkar, D P ^d   Kawar, R K ^c  

^a SHIVAJI UNIVERSITY   (India)

^b Shivraj College   (India)

^c SGM College   (India)

^d CENTRE FOR MATERIALS FOR ELECTRONICS TECHNOLOGY C MET   (India)

Author keywords

Characterization; Iridium oxide thin films; Spray pyrolysis technique; X ray diffraction

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY; GLASS; INFRARED SPECTROSCOPY; IRIDIUM COMPOUNDS; POLYCRYSTALLINE MATERIALS; PYROLYSIS; SPRAYING; X RAY DIFFRACTION ANALYSIS;

SPRAY PYROLYSIS TECHNIQUES (SPT);

THIN FILMS;

EID: 0038219637     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(03)00132-9     Document Type: Article

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