Alpha-particle-induced ser of embedded SRAMs affected by variations in process parameters and by the use of process options

Solid-State Electronics

Volumn 49, Issue 11 SPEC. ISS., 2005, Pages 1783-1790

  Heijmen, Tino ^a   Kruseman, Bram ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Alpha particles; Critical charges; Process variations; Radiation effects; SER; Soft errors; SRAM

Indexed keywords

ALPHA PARTICLES; COMPUTER SIMULATION; DATA REDUCTION; ELECTRIC CHARGE; EMBEDDED SYSTEMS; RADIATION EFFECTS; STATISTICAL METHODS;

CRITICAL CHARGES; PROCESS VARIATIONS; SER; SOFT ERRORS;

STATIC RANDOM ACCESS STORAGE;

EID: 28044459391     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2005.10.025     Document Type: Article

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