Correlated structural and electrical properties of thin manganese oxide films

Thin Solid Films

Volumn 496, Issue 2, 2006, Pages 353-359

  Dakhel, A A ^a  

^a UNIVERSITY OF BAHRAIN   (Bahrain)

Author keywords

Correlated barrier hopping model; Dielectric properties; Manganese oxide

Indexed keywords

ANNEALING; DIELECTRIC PROPERTIES; ELECTRIC INSULATORS; EVAPORATION; FLUORESCENCE; GLASS; MATHEMATICAL MODELS; MOS DEVICES; OXIDES; SUBSTRATES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURES; CORRELATED BARRIER HOPPING MODELS; HIGH-K INSULATORS; MANGANESE OXIDE;

MANGANESE COMPOUNDS;

EID: 28044450902     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.09.024     Document Type: Article

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