Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

Journal of Materials Chemistry

Volumn 15, Issue 43, 2005, Pages 4654-4659

  Petkov, V ^a   Gateshki, M ^a   Choi, J ^b   Gillan, E G ^b   Ren, Y ^c  

^a CENTRAL MICHIGAN UNIVERSITY   (United States)

^b E11 SSH   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; NANOSTRUCTURED MATERIALS; X RAY DIFFRACTION ANALYSIS;

PAIR DISTRIBUTION FUNCTION (PDF); STRUCTURAL COHERENCE; WURTZITE STRUCTURE;

GALLIUM NITRIDE;

EID: 27944502598     PISSN: 09599428     EISSN: 13645501     Source Type: Journal    
DOI: 10.1039/b509577h     Document Type: Article

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