High real-space resolution measurement of the local structure of Ga1-xInxAs using X-Ray diffraction

Physical Review Letters

Volumn 83, Issue 20, 1999, Pages 4089-4092

  Petkov, V ^a   Jeong, I K ^a   Chung, J S ^a   Thorpe, M F ^a   Kycia, S ^b   Billinge, S J L ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001592857     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.4089     Document Type: Article

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