Rapid structure determination of disordered materials: Study of GeSe 2 glass

Solid State Communications

Volumn 129, Issue 4, 2004, Pages 239-243

  Petkov, V ^a   Qadir, D ^a   Shastri, S D ^b  

^a CENTRAL MICHIGAN UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

A. GeSe2; C. Glass structure; C. X ray scattering

Indexed keywords

CRYSTALLINE MATERIALS; DATA REDUCTION; FOURIER TRANSFORMS; GERMANIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

DISORDERED MATERIALS;

GLASS;

EID: 0345306235     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2003.10.007     Document Type: Article

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