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Volumn , Issue , 2005, Pages 1512-1515

Stucture character of fast growth polycrystalline silicon film from SiCl4/H2

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTALLIZATION; GRAIN SIZE AND SHAPE; HYDROGEN; LOW TEMPERATURE EFFECTS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REACTION KINETICS; THIN FILMS;

EID: 27944458906     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 1
    • 33845463417 scopus 로고    scopus 로고
    • Large-grain polycrystalline silicon films with low intragranular defect density by low-temperature solid-phase crystallization without underlying oxide
    • X.Z. Bo, N. Yao, S.R. Shieh, T.S. Duffy and U.C. Sturm, "Large-grain polycrystalline silicon films with low intragranular defect density by low-temperature solid-phase crystallization without underlying oxide", J. Appl. Phys. 91, 2002, pp. 2910-2915.
    • (2002) J. Appl. Phys. , vol.91 , pp. 2910-2915
    • Bo, X.Z.1    Yao, N.2    Shieh, S.R.3    Duffy, T.S.4    Sturm, U.C.5
  • 3
    • 3142561382 scopus 로고    scopus 로고
    • Electric-field-enhanced crystallization of amorphous silicon
    • J. Jang, J.Y. Oh, S.K. Kim, Y.J. Choi, S.Y. Yoon and C.O. Kim, "Electric-field-enhanced crystallization of amorphous silicon", Nature 395, 1998, 481.
    • (1998) Nature , vol.395 , pp. 481
    • Jang, J.1    Oh, J.Y.2    Kim, S.K.3    Choi, Y.J.4    Yoon, S.Y.5    Kim, C.O.6
  • 6
    • 21544472972 scopus 로고
    • Structural properties of polycrystalline silicon films prepared at low temperature by plasma chemical vapor deposition
    • H.Kakinuma, M.Mohri, M.Sakamoto and T.Tsuruoka, "Structural properties of polycrystalline silicon films prepared at low temperature by plasma chemical vapor deposition", J. Appl. Phys. 70, 1991, pp. 7374-7381.
    • (1991) J. Appl. Phys. , vol.70 , pp. 7374-7381
    • Kakinuma, H.1    Mohri, M.2    Sakamoto, M.3    Tsuruoka, T.4
  • 7
    • 0032614007 scopus 로고    scopus 로고
    • Photoluminescence and Raman studies in thin-film materials: Transition from amorphous to microcrystalline silicon
    • G.Z.Yue, J.D.Lorentzen, J.Lin and D.X.Han, "Photoluminescence and Raman studies in thin-film materials: Transition from amorphous to microcrystalline silicon", Appl. Phys. Lett. 75, 1999, pp. 492-494.
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 492-494
    • Yue, G.Z.1    Lorentzen, J.D.2    Lin, J.3    Han, D.X.4
  • 8
    • 0039463740 scopus 로고
    • Measurements in silane radio frequency glow discharges using a tuned and heated Langmuir probe
    • K.X.Lin, X.Y.Lin, Y.P.Yu, H.Wang and J.Y.Chen, "Measurements in silane radio frequency glow discharges using a tuned and heated Langmuir probe", J. Appl. Phys. 74, 1993, pp. 4899-4902.
    • (1993) J. Appl. Phys. , vol.74 , pp. 4899-4902
    • Lin, K.X.1    Lin, X.Y.2    Yu, Y.P.3    Wang, H.4    Chen, J.Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.