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Volumn , Issue , 2005, Pages 1031-1034

Structural quality of smooth AIC poly-Si films on glass substrates

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; GLASS; POLYSILICON; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION;

EID: 27944451929     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (17)
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  • 6
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    • (2004) Thin Solid Films , vol.451-452 , pp. 328-333
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  • 9
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  • 10
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    • Fast and non-destructive assessment of epitaxial quality of polycrystalline silicon films on glass by optical measurements
    • A. Straub, P.I. Widenborg, A.B. Sproul, Y. Huang, N.-P Harder, and A.G. Aberle, "Fast and non-destructive assessment of epitaxial quality of polycrystalline silicon films on glass by optical measurements", J. Crystal Growth 265, 2004, pp. 168-173.
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  • 11
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    • Optical properties of intrinsic silicon at 300 K
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    • in press
    • P.I. Widenborg, A. Straub, and A.G. Aberle, "Epitaxial thickening of AIC poly-Si seed layers on glass by solid phase epitaxy, Journal of Crystal Growth (in press).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.