Magnetic tunnel junction performance versus barrier thickness: NiFe/AlOx/NiFe junctions fabricated from a wedged Al layer

Applied Physics Letters

Volumn 76, Issue 26, 2000, Pages 3965-3967

  Covington, M ^a,b   Nowak, J ^a   Song, D ^a  

^a SEAGATE TECHNOLOGY   (United States)

^b SEAGATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000855252     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126836     Document Type: Article

References (13)

1. J. S. Moodera, L. R. Kinder, T. M. Wong, and R. Meservery, Phys. Rev. Lett. 74, 3273 (1995).
2. S. S. P. Parkin, K. P. Roche, M. G. Samant, P. M. Rice, R. B. Beyers, R. E. Scheuerlein, E. J. O'Sullivan, S. L. Brown, J. Bucchigano, D. W. Abraham, Y. Lu, M. Rooks, P. L. Trouilloud, R. A. Wanner, and W. J. Gallagher, J. Appl. Phys. 85, 5828 (1999).
3. J. Zhang, Data Storage 31 November (1998).
4. R. C. Sousa, J. J. Sun, V. Soares, P. P. Freitas, A. Kling, M. F. da Silva, and J. C. Soares, Appl. Phys. Lett. 73, 3288 (1998).
5. J. S. Moodera, E. F. Gallagher, K. Robinson, and J. Nowak, Appl. Phys. Lett. 70, 3050 (1997).
6. M. F. Gillies, W. Oepts, A. E. T. Kuiper, R. Coehoorn, Y. Tamminga, J. H. M. Snijders, and W. M. A. Bik, IEEE Trans. Magn. 35, 2991 (1999).
7. T. Mitsuzuka, K. Matsua, A. Kumijo, and H. Tsuge, J. Appl. Phys. 85, 5807 (1999).
8. R. J. M. van de Veerdonk, J. Nowak, R. Meservey, J. S. Moodera, and W. J. M. de Jonge, Appl. Phys. Lett. 71, 2839 (1997).
9. BT, which is valid for the example discussed in the text.
10. J. R. Kirtley, S. Washburn, and D. J. Scalapino, Phys. Rev. B 45, 336 (1992).
11. W. F. Brinkman, R. C. Dynes, and J. M. Rowell, J. Appl. Phys. 41, 1915 (1970).
12. W. F. Egelhoff (unpublished).
13. D. Wang, M. Tondra, C. Nordman, and J. M. Daughton, IEEE Trans. Magn. 35, 2886 (1999).