Determination of the optical properties of sol-gel-derived Pb(Zr xTi(1-x ))O3 thin films by spectroscopic ellipsometry

Ferroelectrics

Volumn 287, Issue , 2003, Pages 35-46

  Yang, Shenghong ^a   Mo, Dang ^b   Tang, Xinggui ^c  

^a FUDAN UNIVERSITY   (China)

^b SUN YAT SEN UNIVERSITY   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Optical property; PZT film; Sol gel technique; Spectroscopic ellipsometry

Indexed keywords

DEPOSITION; ELLIPSOMETRY; ENERGY GAP; OPTICAL PROPERTIES; PARAMETER ESTIMATION; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS;

OPTICAL PROPERTY; PZT FILM; SOL-GEL TECHNIQUE; SPECTROSCOPIC ELLIPSOMETRY;

THIN FILMS;

EID: 15844371858     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190390201298     Document Type: Article

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