Dielectric properties of molybdenum oxide thin films

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 5, 2005, Pages 2743-2752

  Saad, Esmat Abdel Fattah I ^a  

^a Ain Shams University   (Egypt)

Author keywords

Dielectric properties; Electrode film; Grain boundary; Grain bulk; Impedanc measurements; Molybdenum oxide; Relaxation time; Thin films

Indexed keywords

ACTIVATION ENERGY; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; DIELECTRIC PROPERTIES OF SOLIDS; ELECTRODES; EQUIVALENT CIRCUITS; GRAIN BOUNDARIES; MOLYBDENUM OXIDE; OXIDE FILMS; RELAXATION TIME; TEMPERATURE DISTRIBUTION;

ELECTRODE FILM; FREQUENCY DEPENDENCE; GRAIN BULKS; IMPEDANCE MEASUREMENT; MOLECULAR RELAXATION; OPTICAL DIELECTRIC CONSTANT; PARALLEL RESISTANCE; TEMPERATURE DEPENDENCE;

THIN FILMS;

EID: 27844470596     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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