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Volumn 596, Issue 1-3, 2005, Pages 53-60

STM study of the early stages of the Cr/Si(1 1 1) interface formation

Author keywords

Atom solid interactions; Chromium; Scanning tunneling microscopy (STM); Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

CHROMIUM; DEPOSITION; EPITAXIAL GROWTH; MONOLAYERS; MORPHOLOGY; REACTION KINETICS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

EID: 27744491964     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.09.004     Document Type: Article
Times cited : (17)

References (19)
  • 10
    • 14544293176 scopus 로고    scopus 로고
    • Physics of Covered Solid Surfaces
    • H.P. Bonzel Springer-Verlag Berlin, Heidelberg, New York
    • E.G. Seebauer, and M.Y.L. Jung H.P. Bonzel Physics of Covered Solid Surfaces Landolt-Börnstein (New Series) Vol. III/42 2001 Springer-Verlag Berlin, Heidelberg, New York 455
    • (2001) Landolt-Börnstein (New Series) , vol.3-42 , pp. 455
    • Seebauer, E.G.1    Jung, M.Y.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.