RHEED-STM study of iron silicide structures on Si(1 1 1)

Surface Science

Volumn 514, Issue 1-3, 2002, Pages 211-215

  Minami, N ^a   Makino, D ^a   Matsumura, T ^a   Egawa, C ^a   Sato, T ^a   Ota, K ^a   Ino, S ^a  

^a UTSUNOMIYA UNIVERSITY   (Japan)

Author keywords

Epitaxy; Iron; Low index single crystal surfaces; Reflection high energy electron diffraction (RHEED); Scanning tunneling microscopy; Silicides; Silicon

Indexed keywords

DEPOSITION; EPITAXIAL GROWTH; IRON COMPOUNDS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SINGLE CRYSTALS;

IRON SILICIDE;

SURFACE STRUCTURE;

EID: 0037055602     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01631-X     Document Type: Conference Paper

References (20)