Geometry optimization of TMR current sensors for on-chip IC testing

IEEE Transactions on Magnetics

Volumn 41, Issue 10, 2005, Pages 3685-3687

  Phan, Kim Le ^a   Boeve, Hans ^a   Vanhelmont, Frederik ^a   Ikkink, Ton ^a   Talen, Wim ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Current sensor; Integrated circuit (IC) testing; Magnetic random access memory (MRAM); Tunnel magnetoresistance (TMR)

Indexed keywords

ELECTRIC CURRENTS; HEATING; MAGNETIC HYSTERESIS; MAGNETORESISTANCE; MICROMETERS; OPTICAL RESOLVING POWER; OPTIMIZATION; SENSITIVITY ANALYSIS; SENSORS;

CURRENT SENSORS; MAGNETIC RANDOM ACCESS MEMORY (MRAM); SENSOR GEOMETRY; TUNNEL MAGNETORESISTANCE (TMR);

INTEGRATED CIRCUIT TESTING;

EID: 27744484995     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.854813     Document Type: Article

References (5)

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