Unification of double-delay and SOC electromagnetic deembedding

IEEE Transactions on Microwave Theory and Techniques

Volumn 53, Issue 9, 2005, Pages 2892-2898

  Rautio, James C ^a,b   Okhmatovski, Vladimir I ^a,c  

^a IEEE   (United States)

^b Sonnet Software   (United States)

^c UNIVERSITY OF MANITOBA   (Canada)

Author keywords

Calibration; Characteristic impedance; Deembedding; Electromagnetic (EM) analysis; Method of moments (MoM)

Indexed keywords

CHARACTERISTICS IMPEDANCE; DEEMBEDDING; ELECTROMAGNETIC (EM) ANALYSIS; SHORT OPEN CALIBRATION (SOC);

CALIBRATION; ELECTRIC DELAY LINES; ELECTRIC IMPEDANCE; ELECTROMAGNETISM; METHOD OF MOMENTS;

EMBEDDED SYSTEMS;

EID: 27744458827     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.854250     Document Type: Conference Paper

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