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Volumn 47, Issue 1, 1999, Pages 115-119

Comments on “Revisiting Characteristic Impedance and Its Definition of Microstrip Line with a Self-Calibrated 3-D MoM Scheme

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EID: 85008055664     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.740095     Document Type: Note
Times cited : (14)

References (9)
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    • (1982) IEEE MTT-S Int. Microwave Symp. Dig. , pp. 305-307
    • Jansen, R.J.1    Koster, N.H.L.2
  • 2
    • 0026406148 scopus 로고
    • A new definition of characteristic impedance
    • J. C. Rautio, “A new definition of characteristic impedance,” in IEEE MTT-S Int. Microwave Symp. Dig., 1991, pp. 761-764.
    • (1991) IEEE MTT-S Int. Microwave Symp. Dig. , pp. 761-764
    • Rautio, J.C.1
  • 3
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    • The reflection definition of the characteristic impedance of microstrips
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    • F. Arndt and G. U. Paul, “The reflection definition of the characteristic impedance of microstrips,” IEEE Trans. Microwave Theory Tech., vol. MTT-27, pp. 724-731, Aug. 1979.
    • (1979) IEEE Trans. Microwave Theory Tech. , vol.MTT-27 , pp. 724-731
    • Arndt, F.1    Paul, G.U.2
  • 4
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    • Experimental validation of electromagnetic software
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    • J. C. Rautio, “Experimental validation of electromagnetic software,” Int. J. Microwave Millimeter-Wave Computer-Aided Eng., vol. 1, no. 4, pp. 379-385, Oct. 1991.
    • (1991) Int. J. Microwave Millimeter-Wave Computer-Aided Eng. , vol.1 , Issue.4 , pp. 379-385
    • Rautio, J.C.1
  • 5
    • 0028548128 scopus 로고
    • An ultra-high precision benchmark for validation of planar electromagnetic analyzes
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    • J. C. Rautio, “An ultra-high precision benchmark for validation of planar electromagnetic analyzes,” IEEE Trans. Microwave Theory Tech., vol. MTT-42, pp. 2046-2050, Nov. 1994.
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  • 6
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    • J. C. Rautio, “An investigation of an error cancellation mechanism with respect to subsectional electromagnetic analysis validation,” Int. J. Microwave Millimeter-Wave Computer-Aided Eng., vol. 6, no. 6, pp. 430-435, Nov. 1996.
    • (1996) Int. J. Microwave Millimeter-Wave Computer-Aided Eng. , vol.6 , Issue.6 , pp. 430-435
    • Rautio, J.C.1
  • 8
    • 0031999157 scopus 로고    scopus 로고
    • A model for discretization error in electromagnetic analysis of capacitors
    • Feb.
    • E. H. Lenzing and J. C. Rautio, “A model for discretization error in electromagnetic analysis of capacitors,” IEEE Trans. Microwave Theory Tech., vol. MTT-46, pp. 162-166, Feb. 1998.
    • (1998) IEEE Trans. Microwave Theory Tech. , vol.MTT-46 , pp. 162-166
    • Lenzing, E.H.1    Rautio, J.C.2
  • 9
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    • Measurement and modeling of the apparent characteristic impedance of microstrip
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    • W. J. Getsinger, “Measurement and modeling of the apparent characteristic impedance of microstrip,” IEEE Trans. Microwave Theory Tech., vol. MTT-31, pp. 624-632, Aug. 1983.
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    • Getsinger, W.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.