On deembedding of port discontinuities in full-wave CAD models of multiport circuits

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 12, 2003, Pages 2355-2365

  Okhmatovski, Vladimir I ^a   Morsey, Jason ^a,b   Cangellaris, Andreas C ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Deembedding; Full wave computer aided design (CAD); Method of moments (MoM); Multiport; Short open calibration (SOC)

Indexed keywords

CALIBRATION; COMPUTER AIDED DESIGN; ELECTROMAGNETIC FIELD EFFECTS; INTEGRAL EQUATIONS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; METHOD OF MOMENTS; MICROWAVES; MILLIMETER WAVES;

DEEMBEDDING; ELECTROMAGNETIC FIELD SOLVERS; EXCITATION MECHANISMS; MULTIPORT CIRCUITS; PORT DISCONTINUITIES; SHORT-OPEN CALIBRATION;

INTEGRATED CIRCUIT LAYOUT;

EID: 0742321744     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.820159     Document Type: Article

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