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Volumn 53, Issue 2, 2005, Pages 770-776

Deembedding the effect of a local ground plane in electromagnetic analysis

Author keywords

Calibration; Deembedding; Electromagnetic analysis; Imperfect ground; Low temperature co fired ceramic (LTCC); Planar circuit; Surface mount device (SMD); Surface mount technology (SMT)

Indexed keywords

CALIBRATION; FAILURE (MECHANICAL); MICROWAVE CIRCUITS; NATURAL FREQUENCIES; SPURIOUS SIGNAL NOISE; SURFACE MOUNT TECHNOLOGY;

EID: 14544268066     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.840576     Document Type: Conference Paper
Times cited : (38)

References (9)
  • 2
    • 0023399759 scopus 로고
    • An electromagnetic time-harmonic analysis of shielded microstrip circuits
    • Aug.
    • J. C. Rautio and R. F. Harrington, "An electromagnetic time-harmonic analysis of shielded microstrip circuits," IEEE Trans. Microw. Theory Tech., vol. MTT-35, no. 8, pp. 726-730, Aug. 1987.
    • (1987) IEEE Trans. Microw. Theory Tech. , vol.MTT-35 , Issue.8 , pp. 726-730
    • Rautio, J.C.1    Harrington, R.F.2
  • 3
    • 84985370183 scopus 로고
    • A de-embedding algorithm for electromagnetics
    • Jul.
    • J. C. Rautio, "A de-embedding algorithm for electromagnetics," Int. J. Microwave Millim.-Wave Computer-Aided Eng., vol. 1, no. 3, pp. 282-287, Jul. 1991.
    • (1991) Int. J. Microwave Millim.-Wave Computer-aided Eng. , vol.1 , Issue.3 , pp. 282-287
    • Rautio, J.C.1
  • 4
    • 0024765129 scopus 로고
    • Improved calibration and measurement of the scattering parameters of microwave integrated circuits
    • Nov.
    • R. R. Pantoja, M. J. Howes, J. R. Richardson, and R. D. Pollard, "Improved calibration and measurement of the scattering parameters of microwave integrated circuits," IEEE Trans. Microw. Theory Tech., vol. 37, no. 11, pp. 1675-1680, Nov. 1989.
    • (1989) IEEE Trans. Microw. Theory Tech. , vol.37 , Issue.11 , pp. 1675-1680
    • Pantoja, R.R.1    Howes, M.J.2    Richardson, J.R.3    Pollard, R.D.4
  • 5
    • 85008050092 scopus 로고    scopus 로고
    • Comments on 'On deembedding of port discontinuities in full-wave CAD models of multiport circuits'
    • Oct.
    • J. C. Rautio, V. I. Okhmatovski, J. Morsey, and A. C. Cangellaris, "Comments on 'On deembedding of port discontinuities in full-wave CAD models of multiport circuits'," IEEE Trans. Microw. Theory Tech., vol. 52, no. 10, pp. 2448-2449, Oct. 2004.
    • (2004) IEEE Trans. Microw. Theory Tech. , vol.52 , Issue.10 , pp. 2448-2449
    • Rautio, J.C.1    Okhmatovski, V.I.2    Morsey, J.3    Cangellaris, A.C.4
  • 7
    • 0033364161 scopus 로고    scopus 로고
    • Unified equivalent circuit model of planar discontinuities suitable for field theory-based CAD and optimization of M(H)MICs
    • Sep.
    • L. Zhu and K. Wu, "Unified equivalent circuit model of planar discontinuities suitable for field theory-based CAD and optimization of M(H)MICs," IEEE Trans. Microw. Theory Tech., vol. 47, no. 9, pp. 1589-1602, Sep. 1999.
    • (1999) IEEE Trans. Microw. Theory Tech. , vol.47 , Issue.9 , pp. 1589-1602
    • Zhu, L.1    Wu, K.2
  • 8
    • 0742321744 scopus 로고    scopus 로고
    • On deembedding of port discontinuities in full-wave CAD models of multiport circuits
    • Dec.
    • V. I. Okhmatovski, J. Morsey, and A. C. Cangellaris, "On deembedding of port discontinuities in full-wave CAD models of multiport circuits," IEEE Trans. Microw. Theory Tech., vol. 51, no. 12, pp. 2355-2365, Dec. 2003.
    • (2003) IEEE Trans. Microw. Theory Tech. , vol.51 , Issue.12 , pp. 2355-2365
    • Okhmatovski, V.I.1    Morsey, J.2    Cangellaris, A.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.