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Volumn , Issue , 2005, Pages 163-166

CMOS compatible super junction LDMOST with N-Buffer layer

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER CIRCUITS; ELECTRIC BREAKDOWN; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS; SENSITIVITY ANALYSIS;

EID: 27744450918     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (46)

References (6)
  • 2
    • 0034297791 scopus 로고    scopus 로고
    • 120 v interdigitated-drain LDMOS (IDLDMOS) on SOI substrate breaking power LDMOS limit
    • Shuming Xu, K. P. Gan, Ganesh S. Samudra, Yung C. Liang, and Johnny K. O. Sin, "120 V interdigitated-drain LDMOS (IDLDMOS) on SOI substrate breaking power LDMOS limit," IEEE Trans. Electron Devices, Vol. 47, pp. 1980-1985, 2000
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 1980-1985
    • Xu, S.1    Gan, K.P.2    Samudra, G.S.3    Liang, Y.C.4    Sin, J.K.O.5
  • 4
    • 0031251517 scopus 로고    scopus 로고
    • Theory of semiconductor superjunction devices
    • Tatsuhiko Fujihira, "Theory of semiconductor superjunction devices," Jpn. J. Appl. Phys. Vol. 36, pp. 6254-6262, 1997
    • (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 6254-6262
    • Fujihira, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.