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Volumn 53, Issue 10, 2005, Pages 3057-3066

Detailed distortion analysis technique based on simulated large-signal voltage and current spectra

Author keywords

Distortion analysis; Memory effects; Polynomial device model; Volterra analysis

Indexed keywords

DISTORTION ANALYSIS; MEMORY EFFECTS; POLYNOMIAL DEVICE MODEL; VOLTERRA ANALYSIS;

EID: 27644578014     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.855132     Document Type: Article
Times cited : (45)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.