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Volumn 88, Issue 4, 2005, Pages 1007-1009

Effect of ac-powered water electrolysis on the structural and optical properties of indium tin oxide thin films

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; ELECTROLYSIS; INDIUM COMPOUNDS; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TIN COMPOUNDS; X RAY DIFFRACTION;

EID: 27644567197     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00191.x     Document Type: Article
Times cited : (6)

References (10)
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    • W. P. Chen, H. L. W. Chan, F. C. H. Yiu, K. M. W. Ng, and P. C. K. Liu, "Water-Induced Degradation in Lead Zirconate Titanate Piezoelectric Ceramics," Appl. Phys. Lett., 80, 3587-89 (2002).
    • (2002) Appl. Phys. Lett. , vol.80 , pp. 3587-3589
    • Chen, W.P.1    Chan, H.L.W.2    Yiu, F.C.H.3    Ng, K.M.W.4    Liu, P.C.K.5
  • 4
    • 36549102198 scopus 로고
    • Effect of hydrogen plasma treatment on transparent oxide films
    • S. Major, S. Kumar, M. Bhatnagar, and K. L. Chopra, "Effect of Hydrogen Plasma Treatment on Transparent Oxide Films," Appl. Phys. Lett., 49, 394-6 (1986).
    • (1986) Appl. Phys. Lett. , vol.49 , pp. 394-396
    • Major, S.1    Kumar, S.2    Bhatnagar, M.3    Chopra, K.L.4
  • 5
    • 0032741533 scopus 로고    scopus 로고
    • Radiation damage in air annealed indium tin oxide layers
    • A. Salehi, "Radiation Damage in Air Annealed Indium Tin Oxide Layers," Thin Solid Films, 338, 197-200 (1999).
    • (1999) Thin Solid Films , vol.338 , pp. 197-200
    • Salehi, A.1
  • 7
    • 0030171653 scopus 로고    scopus 로고
    • A degradation mechanism of organic light-emitting devices
    • H. Aziz and G. Xu, "A Degradation Mechanism of Organic Light-Emitting Devices," Synthetic Met., 80, 7-10 (1996).
    • (1996) Synthetic Met. , vol.80 , pp. 7-10
    • Aziz, H.1    Xu, G.2
  • 8
    • 79955988118 scopus 로고    scopus 로고
    • Degradation and failure of organic light-emitting devices
    • L. Ke, S. J. Chua, K. R. Zhang, and N. Yakovlev, "Degradation and Failure of Organic Light-Emitting Devices," Appl. Phys. Lett., 80, 2195-7 (2002).
    • (2002) Appl. Phys. Lett. , vol.80 , pp. 2195-2197
    • Ke, L.1    Chua, S.J.2    Zhang, K.R.3    Yakovlev, N.4
  • 9
    • 0001511254 scopus 로고    scopus 로고
    • Stability of the interface between indium tin oxide and poly(3,4-elhylenedioxythiophene)/ poly(styrenesulfonate) in polymer light-emitting diodes
    • M. P. de Jong, L. J. van IJzendoorn, and M. J. A. de Voigt, "Stability of the Interface between Indium Tin Oxide and Poly(3,4-elhylenedioxythiophene)/ Poly(styrenesulfonate) in Polymer Light-emitting Diodes," Appl. Phys. Lett., 77, 2255-7 (2000).
    • (2000) Appl. Phys. Lett. , vol.77 , pp. 2255-2257
    • De Jong, M.P.1    Van Ijzendoorn, L.J.2    De Voigt, M.J.A.3
  • 10
    • 0035455383 scopus 로고    scopus 로고
    • Degradation of ITO/PET films in humid and contaminative environments studied by TEM
    • G. S. Park and J. K. Kwon, "Degradation of ITO/PET Films in Humid and Contaminative Environments Studied by TEM," J. Mater. Sci. Mater. Electron., 12, 497-503 (2001).
    • (2001) J. Mater. Sci. Mater. Electron. , vol.12 , pp. 497-503
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.