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Journal of Materials Science: Materials in Electronics

Volumn 12, Issue 9, 2001, Pages 497-503

Degradation of ITO/PET films in humid and contaminative environments studied by TEM

(2) Park, G S a Kwon, J K a

a Samsung Advanced Institute of Technology (SAIT) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; DEGRADATION; INDIUM COMPOUNDS; MICROSTRUCTURE; PHOTORESISTS; TRANSMISSION ELECTRON MICROSCOPY;

CONTACT RESISTANCE; ULTRAMICROTOMY TECHNIQUE;

CONDUCTIVE FILMS;

EID: 0035455383 PISSN: 09574522 EISSN: None Source Type: Journal
DOI: 10.1023/A:1012493207997 Document Type: Article

Times cited : (11)

References (11)

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2
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7
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9
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10
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- Shindo, D.¹ Park, G.-S.² Waseda, Y.³ Sugimoto, T.⁴

11
- 0029887186
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- Park, G.-S.¹ Shindo, D.² Waseda, Y.³ Sugimoto, T.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.