Radiation damage in air annealed indium tin oxide layers

Thin Solid Films

Volumn 338, Issue 1-2, 1999, Pages 197-200

  Salehi, A ^a  

^a K N TOOSI UNIVERSITY OF TECHNOLOGY   (Iran)

Author keywords

Annealing; Indium tin oxide (ITO); Optoelectronics; Particle radiation damage; Scanning electron microscopy (SEM)

Indexed keywords

ANNEALING; OPACITY; OPTOELECTRONIC DEVICES; PROTON IRRADIATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS;

INDIUM TIN OXIDE;

SEMICONDUCTING FILMS;

EID: 0032741533     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00960-2     Document Type: Article

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