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Volumn 52, Issue 8, 2005, Pages 1354-1359

Interferometric detection in picosecond ultrasonics for nondestructive testing of submicrometric opaque multilayered samples: TiN/AlCu/TiN/Ti/Si

Author keywords

[No Author keywords available]

Indexed keywords

NANOMETRIC THIN FILMS; PICOSECOND ULTRASONIC TECHNIQUES; SUBMICROMETRIC LAYERS;

EID: 27644564188     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2005.1509794     Document Type: Article
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.