SCOPUS 정보 검색 플랫폼

Volumn 13, Issue 22, 2005, Pages 8760-8765

Surface structure silicon based impact-ionization multiplier for optical detection

Author keywords

[No Author keywords available]

Indexed keywords

ION IMPLANTATION; IONIZATION; LEAKAGE CURRENTS; MICROELECTRONIC PROCESSING; PHOTODIODES; SILICON;

CURENT SOURCES; CURRENT AMPLIFIERS; IMPACT-IONIZATION MULTIPLIERS; OPTICAL DETECTION;

AMPLIFIERS (ELECTRONIC);

EID: 27544488722 PISSN: 10944087 EISSN: 10944087 Source Type: Journal
DOI: 10.1364/OPEX.13.008760 Document Type: Article

Times cited : (11)

References (8)

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2
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