Thermal diffusivity of surface-microstructured silicon measured by photothermal deflection technique

Materials Letters

Volumn 60, Issue 1, 2006, Pages 63-66

  Chen, Xiao ^a   Zhu, Jingtao ^a,b   Yin, Gang ^a   Zhao, Li ^a  

^a FUDAN UNIVERSITY   (China)

^b TONGJI UNIVERSITY   (China)

Author keywords

Femtosecond laser pulses; Photothermal deflection; Silicon surface microstructure; Thermal diffusivity; Thermal properties

Indexed keywords

LASER BEAM EFFECTS; LASER PULSES; THERMAL DIFFUSION; THERMODYNAMIC PROPERTIES;

AMBIENT GAS; FEMTOSECOND LASER PULSES; PHOTOTHERMAL DEFLECTION; SILICON SURFACE MICROSTRUCTURE;

SILICON;

EID: 27544481676     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2005.07.072     Document Type: Article

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