Continuous free-flow electrophoresis of water-soluble monolayer-protected clusters

Analytical Chemistry

Volumn 77, Issue 14, 2005, Pages 4348-4353

  Peterson, Rachel R ^a   Cliffel, David E ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; MONOLAYERS; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; SEPARATION; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY;

HISTOGRAMS; MILLIGRAMS SCALES; MONOLAYER PROTECTED CLUSTERS (MPC); TRIPONIN;

ELECTROPHORESIS;

GOLD; METAL; NANOPARTICLE; TIOPRONIN; WATER;

ARTICLE; CONTINUOUS FREE FLOW ELECTROPHORESIS; ELECTROCHEMISTRY; ELECTROPHORESIS; FLOW; FRACTIONATION; PARTICLE SIZE; SEPARATION TECHNIQUE; SOLUBILITY; SURFACE PLASMON RESONANCE; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY;

EID: 27544479548     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0502495     Document Type: Article

References (32)

1. Brust, M.; Walker, M.; Bethell, D.; Schiffrin, D. J.; Whyman, R. J. Chem. Soc., Chem. Commun. 1994, 801-802.
2. Hosteller, M. J.; Wingate, J. E.; Zhong, C-J.; Harris, J. E.; Vachet, R. W.; Clark, M. R.; Londono, J. D.; Green, S. J.; Stokes, J. J.; Wingnall, G. D.; Glish, G. L.; Porter, M. D.; Evans, N. D.; Murray, R. W. Langmuir 1998, 14, 17-30.
3. Templeton, A. C.; Wuelfing, W. P.; Murray, R. W. Acc. Chem. Res. 2000, 33, 27-36.
4. Brust, M.; Bethell, D.; Kelly, C. J.; Schiffrin, D. J. Langmuir 1998, 14, 5425-5429.
5. Cliffel, D. E.; Hicks, J. F.; Templeton, A. C.; Murray, R. W. In Handbook of Metal Nanoparticles; Feldheim, D., Foss, C., Eds.; Marcel Dekker: New York, 2002.
6. Zamborini, F. P.; Hicks, J. F.; Murray, R. W. J. Am. Chem. Soc. 2000, 122, 4514-4515.
7. Wuelfing, W. P.; Green, S. J.; Pietron, J. J.; Cliffel, D. E.; Murray, R. W. J. Am. Chem. Soc. 2000, 122, 11465-11472.
8. Eklund, S. E.; Cliffel, D. E. Langmuir 2004, 20, 6012-6018.
9. Waszczuk, P.; Solla-Gullon, J.; Kim, H. S.; Montiel, V.; Aldaz, A.; Wieckowski, A. J. Catal. 2001, 203, 1-6.
10. Devenish, R. W.; Goulding, T.; Heaton, B. T.; Whyman, R. J. Chem. Soc., Dalton Trans. 1996, 5, 673-679.
11. Schaaff, T. G.; Whetten, R. L. J. Phys. Chem. B 1999, 103, 9394-9396.
12. Hicks, J. F.; Miles, D. T.; Murray, R. W. J. Am. Chem. Soc. 2002, 124, 13322-13328.
13. Hicks, J. F.; Templton, A. C.; Chen, S.; Sheran, K. M.; Jasti, R.; Murray, R. W.; Debord, J.; Schaaff, T. G.; Whetten, R. L. Anal. Chem. 1999, 71, 3703-3711.
14. Whetten, R. L.; Khoury, J. T.; Alvarez, M. M.; Murthy, S.; Vezmar, I.; Wang, Z. L.; Stephens, P. W.; Cleveland, C. L.; Luedtke, W. D.; Landman, U. Adv. Mater. 1996, 8, 428-433.
15. Wilcoxon, J. P.; Martin, J. E.; Provencio, P. Langmuir 2000, 16, 9912-9920.
16. Song, Y.; Jimenez, V.; McKinney, C.; Donkers, R.; Murray, R. W. Anal. Chem. 2003, 75, 5088-5096.
17. Jimenez, V. L.; Leopold, M. C.; Mazzitelli, C.; Jorgenson, J. W.; Murray, R. W. Anal. Chem. 2003, 75, 199-206.
18. Templeton, A. C.; Cliffel, D. E.; Murray, R. W. J. Am. Chem. Soc. 1999, 121, 7081-7089.
19. Parak, W. J.; Pellegrino, T.; Micheel, C. M.; Gerion, D.; Williams, S. C.; Alivisatos, A. P. Nano Lett. 2003, 3, 33-36.
20. Sengelov, H.; Borregaard, N. J. Immunol. Methods 1999, 232, 145-152.
21. Mazereeuw, M.; Best, C. M. d.; Tjaden, U. R.; Irth, H.; Greef, J. v. d. Anal. Chem. 2000, 72, 3881-3886.
22. Hoffman, P.; Ji, H.; Moritz, R. L.; Connolly, L. M.; Frecklington, D. F.; Layton, M. J.; Edds, J. S.; Simpson, R. J. Proteomics 2001, 1, 807-818.
23. Richman, D. W. McDonnell Douglas Corp., 1999.
24. Lao, A. L. K.; Trau, D.; Hsing, I.-M. Anal. Chem. 2002, 74, 5364-5369.
25. Roman, M. C.; Brown, P. R. Anal. Chem. 1994, 66, 86A-94A.
26. Mulvaney, P. Langmuir 1996, 12, 788-800.
27. Alvarez, M. M.; Khoury, J. T.; Schaaff, T. G.; Shafigullin, M. N.; Vezmar, I.; Whetten, R. L. J. Phys. Chem. B 1997, 101, 3706-3712.
28. Spence, J. C. H. High-Resolution Electron Microscopy, 3rd ed.; University Press: Oxford, U.K., 2003.
29. Templeton, A. C.; Chen, S.; Gross, S. M.; Murray, R. W. Langmuir 1999, 15, 66-76.
30. Dr. James Wittig of the Vanderbilt University School of Engineering department calibrated the Philips CM20 TEM upon receiving the instrument and determined that it has maximum resolution of 0.29 nm.
31. While TEM is a very useful technique for measuring the sizes of larger particles, there was difficulty focusing on the smallest MPCs that led to several blurred images that were not used in the analysis of the MPC particle diameter. The MPC samples examined by TEM were dialyzed for 1 week before the analysis in order to limit aggregation of the MPCs. Even with dialysis, there was some ionic agglomeration of the MPCs samples. These aggregates were not included in analysis for MPC particle diameter.
32. The samples fractionated using the optimized conditions were not diluted due to the very small amount of particles in some of the collection vials. The UV-visible spectra from the undiluted MPCs could not be normalized to the same scale.