The impact on materials science of ion beam analysis with electrostatic accelerators

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 240, Issue 1-2, 2005, Pages 1-12

  Amsel, G ^a   Battistig, G ^b  

^a SORBONNE UNIVERSITÉ   (France)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

Electrostatic accelerator; Ion beam analysis; Materials science; Stable isotopic tracing

Indexed keywords

CRYSTALLINE MATERIALS; ELECTROSTATIC ACCELERATORS; ION BEAMS; ISOTOPES; RESONANCE; THIN FILMS;

ION BEAM ANALYSIS; SOLID STATE ELECTROCHEMISTRY; STABLE ISOTOPIC TRACING; THIN FILM DEPOSITION;

MATERIALS SCIENCE;

EID: 27344453950     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.06.078     Document Type: Conference Paper

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