Structural instability of Si(1 1 1)-(7 × 7) induced by low-energy electron irradiation

Surface Science

Volumn 593, Issue 1-3, 2005, Pages 168-172

  Sugita, Y ^a   Horiike, H ^a   Kanasaki, J ^a   Tanimura, K ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Desorption induced by electron stimulation; Electron bombardment; Scanning tunneling microscopy; Silicon; Surface roughening

Indexed keywords

CHEMICAL BONDS; ELECTRIC EXCITATION; SILICON; SURFACE PLASMON RESONANCE; SURFACES;

DESORPTION INDUCED BY ELECTRON STIMULATION; ELECTRON BOMBARDMENT; PRIMARY ENERGIES; SURFACE ROUGHENING;

ELECTRON IRRADIATION;

EID: 26444532879     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.06.089     Document Type: Conference Paper

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