Transmission electron microscopy studies of nanostructured TiO2 films on various substrates

Vacuum

Volumn 80, Issue 4, 2005, Pages 371-378

  Djerdj, I ^a   Tonejc, A M ^a   Bijelic M ^a   Vranesa V ^b   Turkovic A ^b  

^a UNIVERSITY OF ZAGREB   (Croatia)

^b RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

Average grain size; Chemical vapour deposition; SAED Rietveld refinement; Titanium dioxide; Transmission electron microscopy

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DYES; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; POTASSIUM COMPOUNDS; SOLAR CELLS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

AVERAGE GRAIN SIZE; DYE-SENSITIZED SOLAR CELLS; SAED RIETVELD REFINEMENT; SELECTED AREA ELECTRON DIFFRACTION (SAED);

TITANIUM DIOXIDE;

EID: 26444491663     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2005.06.015     Document Type: Article

References (28)

1. G.D. Ulrich Chem Eng News 62 1984 22
2. S.E. Prasatsinis Chem Eng Prog 8 1989 62
3. S.H. Huang, T.F. Lin, S.Y. Lu, and K.S. Chou J Mater Sci 34 1999 4293
4. K. Luterova, A. Poruba, J. Dian, O. Salyk, P. Horvath, and P. Knapek J Porous Mater 7 2000 135
5. S. Fan, M.G. Chapline, N.R. Franklin, T.W. Tombler, A.M. Cassell, and H. Dai Science 283 5401 1999 512
6. D. Titiher, W. Ahmed, and E. Ahmed J Mater Sci 32 1997 1931
7. B. Vlahović, and M. Peršin J Phys D 23 1990 1324
8. D.W. Murphy, P.A. Christian, F.J. DiSalvo, and J.N. Cardies J Electrochem Soc 126 1979 497
9. A. Hagfeldt, and M. Grätzel Chem Rev 95 1 1995 40
10. A. Turković, M. Gaberšček, and Z. Crnjak Orel Solid State Ionics 2004 submitted for publication
11. C. Julien, E. Haro-Pontiatovski, M.A. Camacho-Lopez, L. Escorbar-Alarcon, and Jimenez-Jarquin J Mater Sci Eng 65 1999 170
12. M. Losurdo, D. Barreca, G. Bruno, and E. Tondello Thin Solid Films 384 2001 58
13. C. Julien, J.P. Guesdon, A. Gorenstein, A. Khelfa, and I. Ivanov Appl Surf Sci 90 1995 389
14. Z.C. Orel, D. Kuščer, M. Kosec, and A. Turković Prog Colloid Polym Sci 128 2004 1 6
15. A. Turković, N. Radić, D. Šokčević, T. Valla, M. Milun, and J. Rukavina Fizika A 2 1 1993 23 34
16. Th.E. Weirich, M. Winterer, S. Seifried, H. Hahn, and H. Fuess Ultramicroscopy 81 2000 263 270
17. A.M. Tonejc, I. Djerdj, and A. Tonejc Mater Sci Eng C 19 2002 85 89
18. X.D. Zou, Y. Sukharev, and S. Hovmöller Ultramicroscopy 52 1993 436 444
19. R.A. Young, and D.B. Wiles J Appl Crystallogr 15 1982 430
20. J.S. Jiang, and F.H. Li Acta Phys Sin 33 1984 845 849
21. R.J. Hill, and C.J. Howard J Appl Cryst 20 1987 467 476
22. A. Agresti, and B.F. Agresti Statistical methods for the social sciences 1979 Dellen Publishing Company San Francisco, CA p. 184
23. A.M. Tonejc, I. Djerdj, and A. Tonejc Mat Sci Eng B 85 2001 55 63
24. A.M. Tonejc, M. Gotić, B. Gržeta, S. Musić, S. Popović, and R. Trojko Mat Sci Eng B 40 1996 177 184
25. M. Ivanda, A.M. Tonejc, I. Djerdj, M. Gotić, S. Musić, and G. Mariotto Springer lecture notes in physics: nanoscale spectroscopy and its application to semiconductor research 2002 Springer Berlin p. 24-36
26. K.D. Rogers, D.W. Lane, J.D. Painter, and A. Chapman Thin Solid Films 466 2004 97 102
27. T.J. Vink, W. Walrave, J.L.C. Daams, A.G. Dirks, M.A.J. Somers, and K.J.A. van den Aker J Appl Phys 74 2 1993 988 995
28. Djerdj I, et al. Vacuum, 2005, accepted for publication.