Rietveld analysis of electron powder diffraction data from nanocrystalline anatase, TiO2

Ultramicroscopy

Volumn 81, Issue 3-4, 2000, Pages 263-270

  Weirich, Th E ^a   Winterer, M ^a   Seifried, S ^a   Hahn, H ^a   Fuess, H ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Electron power diffraction; Nanocrystalline anatase; Rietveld refinement

Indexed keywords

LATTICE CONSTANTS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; NEUTRON DIFFRACTION; PHOTOGRAPHIC FILMS; POLYCRYSTALLINE MATERIALS; THIN FILMS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON POWDER; ELECTRON POWDER DIFFRACTION; NANOCRYSTALLINE ANATASE; RIETVELD ANALYSIS;

ELECTRON DIFFRACTION;

TITANIUM DIOXIDE;

ARTICLE; CRYSTAL; DRUG STRUCTURE; ELECTRON DIFFRACTION; TECHNIQUE;

EID: 0034069753     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00189-8     Document Type: Article

References (47)

1. Scherrer P. Göttinger Nachr. 2:1918;98.
2. Williamson G.K., Hall W.H. Acta Metall. 1:1953;22.
3. Warren B.E., Averbach B.L. J. Appl. Phys. 21:1950;595.
4. Mott N.F. Nature (London). 124:1929;986.
5. Mark H., Wierl R. Z. Phys. 60:1930;741.
6. Yearian H.J., Howe J.D. Phys. Rev. 48:1935;381.
7. Lennander S. Ark. Fys. 8:1954;551.
8. Kuwabara S. J. Phys. Soc. Japan. 12:1957;637.
9. Blackman M. Proc. Roy. Soc. (London) A. 173:1939;68.
10. Yamzin I.I., Pinsker Z.G. Dokl. Akad. Nauk SSSR. 65:1949;645.
11. Honjo G., Kitamura N. Acta Crystallogr. 10:1957;533.
12. Horstmann M., Meyer G. Acta Crystallogr. 15:1962;271.
13. Wedel N. Acta Crystallogr. 16:1963;1213.
14. B. K. Vainshtein, Structure Analysis by Electron Diffraction, Pergamon Press, Oxford 1964, p. 154.
15. Turner P.S., Cowley J.M. Acta Crystallogr. A. 25:1969;475.
16. J. M. Cowley, in: A.J.C. Wilson (Ed.), Int. Tables for Crystallography, Vol. C, Kluwer Academic Publishers, Dordrecht 1992, p. 80.
17. D.B. Williams, C.B. Carter, Transmission Electron Microscopy, Vol. 2, Plenum Press, New York, 1996, pp. 203, 273.
18. Weirich T.E., Ramlau R., Simon A., Hovmöller S., Zou X.D. Nature (London). 382:1996;144.
19. Weirich T.E., Hovmöller S., Kalpen H., Ramlau R., Simon A. Crystallogr. Rep. 43:1998;956.
20. Weirich T.E., Zou X.D., Ramlau R., Simon A., Cascarano G.L., Giacovazzo C., Hovmöller S. Acta Crystallogr. A. 56:2000;29.
21. König H. Die Naturwissenschaften. 33:1946;343.
22. Witt W. Z. Naturforschung. 19a:1964;1363.
23. Meyerhoff K. Acta Crystallogr. 12:1959;330.
24. Meyerhoff K. Z. Naturforsch. 12a:1957;23.
25. Carr M.J., Lyman C.E., Cowley J.M. Cowley J.M. Electron Diffraction Techniques. Vol. 1:1992;212-215 Oxford University Press, Oxford.
26. Pinsker Z.G. Electron Diffraction. 1953;Butterworths Scientific Publications, London.
27. Vainshtein B.K., Zvyagin B.B., Avilov A.S. Cowley J.M. Electron Diffraction Techniques. Vol. 1:1992;216-312 Oxford University Press, Oxford.
28. S. Seifried, M. Winterer, H. Hahn, Chemical Vapour Synthesis, to be published.
29. J. Rodriguez-Carvajal, FULLPROF - A program for Rietveld, Profile Matching and Integrated Intensities Refinement of X-ray and/or Neutron Data, Laboratoire Léon Brillouin, CEA-Saclay, France.
30. T. Roisnel, J. Rodriguez-Carvajal, WINPLOTR, a new tool for powder diffraction, Laboratoire Léon Brillouin, CEA-Saclay, France.
31. J. Gonzalez-Platas, J. Rodriguez-Carvajal, GFP-GRAPHIC FOURIER PROGRAM, Laboratoire Léon Brillouin, CEA-Saclay, France.
32. S Jiang J., Li F.H. Acta Phys. Sin. 33:1984;845.
33. Rietveld H.M. Acta Crystallogr. 22:1967;151.
34. Rietveld H.M. J. Appl. Crystallogr. 2:1969;65.
35. Young R.A. The Rietveld Method. 1995;Oxford University Press, Oxford.
36. D.L. Bish, J.E. Post (Eds.), Reviews in Mineralogy, Vol. 20, 1989, Mineralogical Society of America, USA.
37. Burdett J.K., Hughbanks T., Miller G.J., Richardson J.W., Smith J.V. J. Am. Chem. Soc. 109:1987;3639.
38. Brown A., Edmonds J.W. Adv. X-ray Anal. 23:1980;361.
39. Howard C.J., Sabine T.M., Dickson F. Acta Crystallogr. B47:1991;462.
40. Khitrova V.I., Bundule M.F., Pinsker Z.G. Kristallografiya. 22:1977;1253.
41. Schoening F.R.L. J. Appl. Crystallogr. 6:1973;145.
42. Neder R.B. Z. Krist. 210:1995;415.
43. Horstmann M. Z. Phys. 183:1965;375.
44. Kuwabara S. J. Phys. Soc. Japan. 22:1967;1245.
45. Carlsson A., Oku T., Bovin J.O., Wallenberg R., Malm J.O., Schmid G., Kubicki T. Angew. Chemie Int. Ed. 37:1998;1217.
46. Pawley G.S. J. Appl. Crystallogr. 14:1981;357.
47. Altomare A., Burla M.C., Camalli M., Cascarano G., Giacovazzo C., Guagliardi A., Moliterni A.G.G., Polidori G., Spagna R. J. Appl. Cryst. 32:1999;115.