Paramagnetic structural defects and conductivity in hydrogenated nanocrystalline carbon-doped silicon films

Semiconductors

Volumn 38, Issue 5, 2004, Pages 528-530

  Shevaleevskii, O I ^a   Tsvetkov, A A ^a   Larina, L L ^a   Myong, S Y ^b   Lim, K S ^b  

^a EMANUEL INSTITUTE OF BIOCHEMICAL PHYSICS   (Russian Federation)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2642541121     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1755884     Document Type: Article

References (16)

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