High-resolution on-chip propagation delay detector for measuring within-chip variation

2005 International Conference on Integrated Circuit Design and Technology, ICICDT

Volumn , Issue , 2005, Pages 217-220

  Matsumoto, Takashi ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

CMOS; Design automation; DLL; Propagation delay; Sub 100nm; Within chip variation

Indexed keywords

AUTOMATION; ELECTRIC POTENTIAL; INTEGRATED CIRCUIT LAYOUT; LOGIC CIRCUITS; VOLTAGE CONTROL;

DELAY-LOCKED LOOP (DLL); PROPAGATION DELAY; VOLTAGE-CONTROLLED DELAY LINE (VCDL);

CMOS INTEGRATED CIRCUITS;

EID: 25844487780     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icicdt.2005.1502634     Document Type: Conference Paper

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