Structural and ferroelectric properties of yttrium substituted bismuth titanium thin films

Thin Solid Films

Volumn 492, Issue 1-2, 2005, Pages 264-268

  Ma, J ^a   Gu, J ^a   Su, D ^a   Wu, X M ^a   Song, C H ^a   Li, W ^a   Lu, X M ^a   Zhu, J S ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Bismuth titanate; Ferroelectric properties; Structural properties; X ray diffraction

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL ORIENTATION; DECOMPOSITION; POLARIZATION; POLYCRYSTALLINE MATERIALS; RAMAN SCATTERING; REMANENCE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; YTTRIUM;

BISMUTH TITANATE; FERROELECTRIC MEASUREMENTS; FERROELECTRIC PROPERTIES; METAL-ORGANIC DECOMPOSITION; STRUCTURAL PROPERTIES;

FERROELECTRIC THIN FILMS;

EID: 25644449763     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.117     Document Type: Article

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