Structural and optical properties of Bi4-xNdxTi 3O12 thin films prepared by metal-organic solution deposition

Materials Letters

Volumn 58, Issue 5, 2004, Pages 813-816

  Wang, Yuehua ^a   Xu, Guoding ^a   Zhang, Xuejin ^a   Feng, Yan ^a   Tang, Weishi ^a   Cheng, Guangxu ^a   Zhu, Yongyuan ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Bi4 xNdxTi3O12; Metal organic solution deposition; Optical waveguide; Prism coupler; Raman spectroscopy

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; BANDWIDTH; BISMUTH COMPOUNDS; CONCENTRATION (PROCESS); DEPOSITION; FREQUENCIES; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; PEROVSKITE; PHASE COMPOSITION; QUARTZ; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SUBSTITUTION REACTIONS; SYNTHESIS (CHEMICAL);

PRISM COUPLERS; VIBRATION MODES;

THIN FILMS;

EID: 0347541016     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2003.07.018     Document Type: Article

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