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Volumn 16, Issue 10, 2005, Pages 2295-2302
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A nanofluidic emitter tip obtained by focused ion beam nanofabrication
a
UNIV LILLE
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
ELECTRIC CURRENTS;
ELECTRIC POTENTIAL;
ETCHING;
FABRICATION;
MASS SPECTROMETRY;
NANOTECHNOLOGY;
ELECTROSPRAY;
EMITTER TIP;
ION BEAM NANOFABRICATION;
ION BEAMS;
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EID: 25444514736
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/16/10/052 Document Type: Article |
Times cited : (16)
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References (22)
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