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Volumn 202, Issue 7, 2005, Pages 1217-1226
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Characterisation of a 760 nm vertical-cavity surface-emitting laser structure by reflectance and photomodulated reflectance
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Author keywords
[No Author keywords available]
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Indexed keywords
CAVITY MODE (CM);
EXCITONIC TRANSITIONS;
OXYGEN SENSING;
PHOTOMODULATED REFLECTANCE (PR);
COMPUTER SIMULATION;
GROUND STATE;
HIGH TEMPERATURE EFFECTS;
NONDESTRUCTIVE EXAMINATION;
OXYGEN;
PHASE TRANSITIONS;
REFLECTION;
SEMICONDUCTOR QUANTUM WELLS;
LASERS;
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EID: 25444495523
PISSN: 18626300
EISSN: 18626319
Source Type: Journal
DOI: 10.1002/pssa.200460902 Document Type: Conference Paper |
Times cited : (3)
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References (19)
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