Advances in the application of modulation spectroscopy to vertical cavity structures

Thin Solid Films

Volumn 450, Issue 1, 2004, Pages 3-13

  Hosea, T J C ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Characterisation; Microcavities; Optical (modulated reflectivity) spectroscopy; Optoelectronics

Indexed keywords

COMPUTER SIMULATION; DOPING (ADDITIVES); ENERGY GAP; INDIUM COMPOUNDS; LASER BEAMS; LIGHT EMITTING DIODES; OPTOELECTRONIC DEVICES; PHOTOLUMINESCENCE; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS;

MICROCAVITIES; OPTICAL (MODULATED REFLECTIVITY) SPECTROSCOPY;

THIN FILMS;

EID: 1142267517     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.040     Document Type: Conference Paper

References (30)

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