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Journal of Applied Physics

Volumn 87, Issue 11, 2000, Pages 7825-7837

The refractive index of AlxGa1-xAs below the band gap: Accurate determination and empirical modeling

(6) Gehrsitz, S a Reinhart, F K b Gourgon, C b Herres, N c Vonlanthen, A a Sigg, H a

a PAUL SCHERRER INSTITUTE (Switzerland)

b EPFL (Switzerland)

c FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000895344 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.373462 Document Type: Article

Times cited : (306)

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