Threshold investigation of oxide-confined vertical-cavity laser diodes

Applied Physics Letters

Volumn 68, Issue 26, 1996, Pages 3689-3691

  Choquette, Kent D ^a   Chow, W W ^a   Hagerott Crawford, M ^a   Geib, K M ^a   Schneider Jr , R P ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CALCULATIONS; CHARGE CARRIERS; CURRENT DENSITY; ELECTRIC RESISTANCE; FERMI LEVEL; GAIN MEASUREMENT; MIRRORS; VOLTAGE MEASUREMENT;

ELECTRICAL CONFINEMENT; FERMI ENERGY; MANY BODY COULOMB EFFECTS; NONRADIATIVE RECOMBINATION; OPTICAL CONFINEMENT; THRESHOLD VOLTAGE; VERTICAL CAVITY SURFACE EMITTING LASERS; WAVELENGTH;

SEMICONDUCTOR LASERS;

EID: 0030166005     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115744     Document Type: Article

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