Morphology and electrical resistivity of metallic nanostructures

Microelectronics Journal

Volumn 36, Issue 3-6, 2005, Pages 555-558

  Camacho, Juan M ^a   Oliva, A I ^a  

^a DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

Author keywords

Electrical resistivity; Grain boundary; Thin metallic film

Indexed keywords

ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; METALLIC FILMS; MORPHOLOGY;

FUCHS-SONDHEIMER (F-S); LOGARITHMIC DISTRIBUTION; THERMAL EVAPORATION; THIN METALLIC FILM;

NANOSTRUCTURED MATERIALS;

EID: 25444440942     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2005.02.068     Document Type: Conference Paper

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