Gallium and oxygen accumulations on gallium nitride surfaces following argon ion milling in ultra-high vacuum conditions

Applied Surface Science

Volumn 230, Issue 1-4, 2004, Pages 18-23

  Butcher, K S A ^a   Afifuddin, ^a   Tansley, T L ^a   Brack, N ^b   Pigram, P J ^b   Timmers, H ^c   Prince, K E ^d   Elliman, R G ^e  

^a MACQUARIE UNIVERSITY   (Australia)

^b LA TROBE UNIVERSITY   (Australia)

^c UNIVERSITY OF NEW SOUTH WALES   (Australia)

^d AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^e AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Argon ion milling; Gallium nitride; Ultra high vacuum

Indexed keywords

ARGON; DESORPTION; EXTRAPOLATION; OPTOELECTRONIC DEVICES; SECONDARY ION MASS SPECTROMETRY; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

ARGON ION MILLING; BAND GAP; ELASTIC RECOIL DETECTION;

GALLIUM NITRIDE;

EID: 2542495326     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.02.029     Document Type: Article

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