Nanostructural and electrical properties of functionally terminated self-assembled monolayers on silicon surfaces

Journal of Applied Physics

Volumn 98, Issue 5, 2005, Pages

  Rittner, M ^a   Martin Gonzalez, M S ^b   Flores, A ^c   Schweizer, H ^a   Effenberger, F ^a   Pilkuhn, M H ^a,c  

^a UNIVERSITY OF STUTTGART   (Germany)

^b INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^c INSTITUTO DE ESTRUCTURA DE LA MATERIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALKYL CHAINS; ELECTRICAL PROPERTIES; SILICON SURFACES; X-RAY REFLECTOMETRY;

ALKYLATION; ELECTRIC CONDUCTANCE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; HYDROXYLATION; MATHEMATICAL MODELS; SELF ASSEMBLY; SILICON; TRANSISTORS; X RAY ANALYSIS;

NANOSTRUCTURED MATERIALS;

EID: 25144455412     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2035309     Document Type: Article

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