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Volumn 98, Issue 4, 2005, Pages

Si wafer bonded of a-Si/a-SiN x distributed Bragg reflectors for 1.55-μm -wavelength vertical cavity surface emitting lasers

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTED BRAGG REFLECTORS; MICROCAVITY; TRANSFER MATRIX METHOD; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

EID: 25144436901     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2009075     Document Type: Article
Times cited : (15)

References (19)
  • 15
    • 25144478640 scopus 로고    scopus 로고
    • Optical Characterisation of Sputtered Silicon Thin Film on Glass, Second World Conference and Exhibition on Photovoltaic Solar Energy Conversion, Vienna, Austria, 6-10 July
    • B. S. Richards, A. B. Sproul, and A. Lambertz, Optical Characterisation of Sputtered Silicon Thin Film on Glass, Second World Conference and Exhibition on Photovoltaic Solar Energy Conversion, Vienna, Austria, 6-10 July 1998 (unpublished).
    • (1998)
    • Richards, B.S.1    Sproul, A.B.2    Lambertz, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.